Fig. 4: High-resolution TEM characterization. | Nature Communications

Fig. 4: High-resolution TEM characterization.

From: Unraveling the origin of air-stability in single-crystalline layered oxide positive electrode materials

Fig. 4

a HRTEM image of SC81-air after ion-milling showing the surface structure. b SAED pattern acquired at the position of (a). c, d The enlarged views of the areas marked with blue and yellow rectangles in (a). e The enlarged views of the areas marked with red rectangle in (a), the inset is corresponding FFT pattern. f Inverse FFT image applying mask, the mask is shown in the inset of (e). g Corresponding GPA result of the area of (e).

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