Fig. 1: Quantitative analysis of structural disorder and chemical defects in Cu-BHT films as a function of composition.

a Synthesis of Cu-BHT films by liquid-liquid interfacial method and diagram of the non-defective lattice of the Cu₃BHT structure reported recently²¹. n in the chemical reaction formula is the ratio of Cu²⁺ to BHT added. b Simulated GIWAXS image of non-defective Cu₃BHT, with detailed peaks assignment in Supplementary Fig. 6. c, d Experimental GIWAXS and SEM images for a crystalline sample with Cu/BHT ratio of 2 and a more amorphous sample with a Cu/BHT ratio of 5, respectively. e Raman spectra of different compositions (see Fig. 3b for corresponding atom displacements). f Cu/S atomic ratios in the films detected by EDX as a function of Cu/BHT mole ratio (loading). The error bars represent the standard deviation of the results obtained from different local positions of the films. g X-ray coherence length and paracrystalline disorder evaluated from WA analysis for the in-plane (h00) and out-of-plane (00 l) diffractions as a function of Cu/BHT ratio. The error bars reflect the uncertainties originating from the fitting of the diffraction peaks when extracting the peak positions and full widths of half maximum. h, i SED maps visualizing the stacking orientation of films with Cu/BHT ratio of 2 and ratio of 3.5 on the nanoscale. Face-on dominant grains (zone axis [002] mostly normal to the substrate) are highlighted in red, edge-on dominant grains (zone axes [200] and [020] mostly normal to the substrate) are highlighted in green and in blue, respectively. White streak lines correspond to grains with intermediate/mixed orientation. Black areas show the regions where diffraction is not good enough to estimate the zone axes.