Fig. 4: Dynamics of the Ag filaments at the local scale. | Nature Communications

Fig. 4: Dynamics of the Ag filaments at the local scale.

From: Unraveling the dynamics of conductive filaments in MoS2-based memristors by operando transmission electron microscopy

Fig. 4

a HAADF image from an image series recorded during a 0 V → 10 V → 0 V → −10 V → 0 V bias voltage sweep applied to another lamella (L2). A frame time of 0.8 s was used. The van der Waals (vdW) gap is defined as D. b False color fast Fourier transform (FFT) from (a). c Cropped FFTs corresponding to the region outlined by the square in (b) at different times from the image series. d The relative changes in Dm (the mean value of D as defined in (a) from each HAADF image), ΔDm, estimated from the image series as a function of time. e Proposed scenario of the structural variation of MoS2 during switching. f HAADF image from L1 acquired after the 0 V → 5 V → 0 V sweep in Fig. 2c with a frame time of ~25 s. The MoS2 bundles are labeled as #1–3. g Intensity profiles along the three arrows labeled as A, B, and C in (f). h Selected false color HAADF images from an image series recorded during a 0 V → 10 V → 0 V → −10 V → 0 V sweep applied to L2, showing the Ag filament dynamics around locally disrupted MoS2 layers. The corresponding bias voltage are labeled at the bottom. The red triangles mark the emerging contrast from Ag filaments.

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