Fig. 3: Transmission electron microscopy (TEM) images of BST-1 sample (a–i) and BST sample (j–l).
From: Ultrahigh thermoelectricity obtained in classical BiSbTe alloy processed under super-gravity
a Low-magnification TEM Image. b High-resolution TEM (HRTEM) image of a randomly selected region in this figure (a). c Atomically resolved scanning transmission electron microscopy high-angle annular dark field (STEM HAADF) image showing a dislocation in a randomly selected region in this figure (a). d–f Inverse fast Fourier transform (IFFT) images in the (015), \(\left(10\bar{5}\right)\), and (110) planes obtained from the area marked by the white rectangle in Fig. 3b. g–i Strain field maps of εxx, εyy, and shear strain εxy for BST-1 sample. j–l Strain field maps of εxx, εyy, and shear strain εxy for BST sample. The color scale corresponds to strain from −20% to 20% with reference to the average strain of a non-defect area.
