Fig. 3: Microscopic characterization of s-Cu2O-NF.

a TEM images of the morphology change of s-Cu2O-NF with different etching times. b HRTEM images of the area marked with a yellow rectangle of s-Cu2O-NF after HCl etching for 15 min. c High-angle annular dark-field image of s-Cu2O-NF and elemental mapping images of Cu, O, and Cl. The (e) HRTEM image (inset is the Fast Fourier transform image), (f) SAED patterns of the area marked with a yellow rectangle and white circle in (d) TEM image of s-Cu2O-NF.