Fig. 3: Single-sample RVS tests on the dielectric strength of hBN nanosheets under mechanical stress.
From: Dielectric strength weakening of hexagonal boron nitride nanosheets under mechanical stress
a, b Sequential I–V curves of single-sample RVS tests on the dielectric strength of 41.3 nm-thick nanosheets with 0 MPa (a) and 490 MPa (b) stress. In single-sample RVS tests, repeated RVS tests are performed on the same island sample. c, d EBD (purple horizontal lines), ELC (green horizontal lines), and their difference (ΔE = EBD−ELC, solid points) of the sequential I–V curves of single-sample RVS tests in a (c) and b (d). The solid lines in c and d are the exponential fitting of ΔE. Source data are provided as a Source Data file.
