Fig. 3: Electron microscopy analysis to understand the achieved high TE performance. | Nature Communications

Fig. 3: Electron microscopy analysis to understand the achieved high TE performance.

From: Versatile polymer-coated Ag2Se thermoelectric materials and devices for multi-scenario applications developed by direct-ink printing

Fig. 3

a SEM image and TEM image (the inset) of PVP@Ag2Se NWs. b HRTEM image of PVP@Ag2Se NWs. The insets show the inverse fast Fourier transform image derived from the blue-framed area, and the enlarged green area for the PVP@Ag2Se NWs. c The enlarged red-framed area in (b). d HAADF-STEM image of PVP@Ag2Se/MC film, and e EDS mappings of Ag, Se, C, and N elements. f HRTEM image of PVP@Ag2Se/MC film with a typical heterointerface. g The enlarged orange-framed area in (f), with the inset showing the corresponding SAED patterns. h HRTEM image of PVP@Ag2Se/MC film showing a transition grain boundary. i Inverse fast Fourier transform image obtained from (h), suggesting typical dislocations.

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