Fig. 6: Characterizations of CEIs.

a–f SEM, focused ion beam-SEM (FIB-SEM), and TEM images of the cycled NCM622 positive electrodes with (a, b, and e) PVEC and (c, d, and f) IWSWN-SPE. g High-resolution TEM images and corresponding FFT for the NCM622 particles cycled in the IWSWN-SPE. h–j F 1 s (h), C 1 s (i), and O 1 s (j) depth sputtering XPS spectra of the cycled NCM622 positive electrodes in the PVEC and IWSWN-SPE. k, l LiF (k) and organic C (l) content distribution derived from XPS results of the cycled NCM622 positive electrodes in the PVEC and IWSWN-SPE. m TOF-SIMS mappings of the cycled NCM622 positive electrodes in the PVEC and IWSWN-SPE. n, o Depth profiles of various elemental segments of the cycled NCM622 positive electrodes in the PVEC and IWSWN-SPE. p Schematic showing the structure and mechanism of different CEIs formed in the PVEC and IWSWN-SPE.