Fig. 4: Scalability.
From: Scalable solution-processed ferroelectric polymers exhibiting markedly enhanced piezoelectricity
a Photo of solution-processed films. b Atomic force microscopy (AFM) topography of commercial PVDF films. c AFM topography of solution-processed films. d The d33 uniformity test with a film size identical to A4 paper where the inset shows double bond -modified P(VDF-TrFE) films and different regions. e Thickness uniformity result. f Comparison of dielectric constant between PVDF and modified P(VDF-TrFE) films. Error bars in d and e represent the standard deviation of the mean obtained from at least three measurements using different samples. Error bars in d and e represent standard deviations obtained from five measurements at selection regions.
