Fig. 3: Microscopic characterizations of various TIP RO membranes.

A Surface morphology of the membranes characterized by a scanning electron microscope (SEM). B Surface structures and roughness of the membranes characterized by an atomic force microscope (AFM). Rq is the root mean square roughness. C Cross-sectional structure of the membranes characterized by a TEM. D SEM images of back-side pores for polyamide layers. E Back pore size measured using the software of Image-Pro Plus (Supplementary Fig. 14). F Nanovoid fraction of the polyamide layers. This value is calculated by the area of nanovoids over the entire area of the polyamide layer based on the TEM images (Supplementary Fig. 15). G Surface area ratio of the membranes, which is calculated by dividing the true surface area of a membrane sample by its projected area. The error bars represent the standard deviation of the results obtained from at least three independent measurements of different membranes.