Fig. 3: Characterizations of the UV-treated OPDs.
From: Light-induced fine-tuning of optical cavities for organic optoelectronic devices
EQEPV spectra and corresponding FWHMs of UV-treated OPDs at the (a) first and (b) second-order cavities. Specific detectivity spectra of UV-treated OPDs at the (c) first and (d) second-order cavities. Dashed lines and solid lines represent the calculated thermal noise-limited \({D}^{*}\)(\({D}_{{therm}}^{*}\)) and real \({D}^{*}\)(\({D}_{{real}}^{*}\)) at short-circuit conditions, respectively. Linear dynamic range of UV-treated OPDs at the (e) first and (f) second-order cavities under 455 nm light irradiation at 0 V. The BF-DPB:NDP9 (10 wt.%) layer is 110 nm or 445 nm in the respective OPDs prior to UV treatment.
