Fig. 3: Interface interaction, photoluminescence imaging, and morphological analysis.

XPS spectra of the a Al 2p, b N 1 s, and c Pb 4 f core levels for the different perovskite films. The Pb0 signal is also marked in the c. d−k PL imaging of control, PDAI2-, AlOx-, and AlOx/PDAI2-treated films, with and without C60, on a silicon/HTL substrate. i-o AFM images of different perovskite films (top panels), with corresponding schematic diagrams (bottom panels). The size of AFM images is 0.5 × 1 μm. The schematic diagram depicts the morphological features extracted from AFM images: PDAI2 forms a homogeneous, undetectable thin film on the perovskite surface (yellow transparent layer); ALD-AlOx is uniformly distributed across the perovskite grain surfaces, with island-like structures emerging at the grain boundaries (blue dots in the grain boundaries); the density of island-like AlOx distribution at the perovskite grain boundaries is significantly reduced with AlOx/PDAI2 treatment.