Fig. 6
From: Ultra-low thermal conductivity of two-dimensional phononic crystals in the incoherent regime
Influence of roughness on κEff and SVR of holey silicon nanostructures at room temperature (a). Rough surface profiles of hole wall generated from Exponential and Gaussian ACF (b). R is the radius of hole. The pitch size of holey silicon is 60 nm, and the neck size is 30 nm
