Fig. 1
From: Automated defect analysis in electron microscopic images
Schematic flow chart of the proposed automated detection approach. Input micrographic images go through the pipeline of module I—Cascade Object Detector, module II—CNN Screening, and module III—Local Image Analysis. After module I, the loop locations and bounding boxes are identified and then further refined to remove false positives using module II. Then module III determines the loop shape and size
