Fig. 2 | npj Computational Materials

Fig. 2

From: Automated defect analysis in electron microscopic images

Fig. 2

Selected bright-field scanning transmission electron microscopy (STEM) image of ferritic alloys showing the common defect types: (1, 2) closed circular/elliptical solid loops, (3) open ellipse loops, (4) open circular loops, and (5) line dislocation segments. Open ellipse loops (3) were selected for automated detection. Image size: 1024 × 1024 pixels; insets scaled arbitrarily

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