Fig. 4 | npj Computational Materials

Fig. 4

From: Automated defect analysis in electron microscopic images

Fig. 4

a Images selected from the complete test set. The selected images were also analyzed by five researchers for the comparison with machine labeling. b Fitted ellipse labeled by the automated machine learning program on the six selected test images. Image size: 1024 × 1024 pixels for all images except image 4, 2048 × 2048 pixels for image 4

Back to article page