Fig. 4 | npj Computational Materials

Fig. 4

From: Online search tool for graphical patterns in electronic band structures

Fig. 4

Sensitivity of the cosine (L2) distance (solid blue line) and the scaled Manhattan (L1) distance (dashed gray line) to various distortions of the Dirac crossing pattern: a shift, b oblique, c skew and d nonlinear distortion/change of the characteristic scale. The distorted patterns are shown for the red dots. High-frequency noise and outliers are not included because band structures are usually smooth objects with low variance over a characteristic scale

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