Fig. 3: Multi-excitation Raman spectra.
From: Advanced machine learning decision policies for diameter control of carbon nanotubes
Average Raman spectra in the RBM region from the growth experiments exhibiting high and low OFs for optimization of the a, b 265 cm−1 and e, f 225 cm−1 RBM peaks, respectively. The asterisks indicate the second-order peak from the silicon substrate. c, d, g, h The peak intensities of the spectra in a, b, e, f respectively, plotted on a Kataura plot and showing the average SWCNT chiral distribution. The red circles and blue triangles in the Kataura plot indicate metallic and semiconducting SWCNTs, respectively. The dashed vertical lines in the graphs indicate the RBM frequency ranges targeted by the planner (i.e., 255–275 and 205–245 cm−1) and the highlighted boxes in c, d, g, h show regions with the most intense RBMs. The good overlaps between the highlighted boxes and the dashed vertical lines in c and g show a higher degree of diameter selectivity in the experiments that exhibited a high OF.
