Fig. 8: Model prediction on V2O5 nanowires within SEM image (957 × 1280 pixels).
From: A deep learned nanowire segmentation model using synthetic data augmentation
a Test image. b Predicted instance masks with lower opacity plotted on the test image. The best performer in AP segmentation mask in Table 4 was used to visualize the prediction masks in b. c Semantic binary mask. While sufficiently good segmentation results are found for overlapping nanowires, several FN pixeled nanowires, indicated by yellow arrows in b were missed by the model. Further discrepancies can be found in the region of agglomeration denoted by FP pixels and white arrows. The absence of optical density information combined with the distinct mode of contrast relative to STXM and X-ray ptychography contribute to the comparably lower prediction performance.
