Fig. 9: Particle statistics from the SEM image.
From: A deep learned nanowire segmentation model using synthetic data augmentation
Histograms and KDE curves are illustrated as a function of area, aspect ratio, and orientation in a–c, respectively. The statistical results show good qualitative agreement. The main discrepancy exists for smaller FN nanowires missed by the model, thus leading to higher-density estimates in the ground truth (manual annotation) in the respective number ranges, e.g. the peak in area size distribution.
