Fig. 4: Gaussian-process-driven experiment.
From: Autonomous scanning probe microscopy investigations over WS2 and Au{111}
a Autonomous scanning tunneling spectroscopy experiment, where an input image (Itunnel = 30 pA, Vsample = 1.6 V), showing a VS within WS2, is used for feature tracking and input into a Gaussian process to determine a corresponding objective and error function to suggest the next point of measurement. Scale bar, 1 nm. b Evolution of an autonomous experiment showing mean and variance functions at a given interval is depicted, where orbital reconstruction is sufficiently reached with only ~1% of points required compared a 128 × 128 pixel grid experiment. c Point defect identification is accomplished at each acquired pixel and the signal summation (0.0V < Vsample < 0.7V) is used for input. d Mean model output after N = 160 points, depicting a defect map of measured in-gap W d states.
