Fig. 7: Effect of dielectric screening on STM images. | npj Computational Materials

Fig. 7: Effect of dielectric screening on STM images.

From: Scanning tunneling microscopy of buried dopants in silicon: images and their uncertainties

Fig. 7

Comparison of simulated STM images of a single dopant computed using a dopant model with statically screened (ϵr = 11.7) Coulomb potential in the left-hand side figure and using a dynamic screening model in the right-hand side figure. The details of the dopant model do not seem to affect the resulting STM images as long as the eigenstate energies are the same for the different models.

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