Fig. 5: Identifying microstructural topological transitions for the physical vapor deposition of thin films.
From: Inferring topological transitions in pattern-forming processes with self-supervised learning
a Sensitivity score for predicting the deposition rate (∣v∣) as a function of the normalized deposition rate. b Sensitivity score for predicting the bulk mobility (MBulk) as a function of the normalized deposition rate. c Variation (derivative) of the sensitivity score for the deposition rate as a function of the normalized deposition rate. d Variation (derivative) of the sensitivity score for predicting the bulk mobility as a function of the normalized deposition rate. e Number of horizontal and vertical phase domains as a function of the normalized deposition rate. f Topology connectivity (defined as the number of irregular elements of morphologies e.g., kinks, terminated subdomains, etc.) as a function of the normalized deposition rate. Thin blue lines in (a) and (b) illustrates particular runs of our procedure and indicate the variability around the averaged sensitivity score.
