Table 3 Comparison between different schemes for the determination of U.
Defect | Uk | ULR | \({E}_{{{{\rm{f}}}}}^{{U}_{{{{\rm{k}}}}}}\) | \({E}_{{{{\rm{f}}}}}^{{U}_{{{{\rm{LR}}}}}}\) | \({E}_{{{{\rm{f}}}}}^{{\alpha }_{{{{\rm{k}}}}}}\) |
---|---|---|---|---|---|
BiVO4 (self-trapped) | 3.5 | 5.4 | −0.49 | −1.34 | −0.63 |
MgO (self-trapped) | 7.7 | 10.9 | −0.64 | −1.67 | −0.53 |
MgO (Li-trapped) | 7.5 | 10.9 | −2.01 | −3.09 | −1.82 |
α-SiO2 (Al-trapped) | 8.3 | 10.1 | −3.27 | −4.00 | −3.11 |