Fig. 2: Response to an external strain component εxx.
From: A planar defect spin sensor in a two-dimensional material susceptible to strain and electric fields
a Axial ZFS parameter D as a function of the external strain. b Orthorhombic ZFS parameter E as a function of the external strain. The cases of fixed and relaxed atomic positions are compared (blue and red points), as explained in the main text. c Local strain response for the externally applied strain. Blue dots show the one-to-one correspondence when the atomic positions are not allowed to relax. Red and green points show the enhanced local εxx strain and the activated local εyy strain around the defect, respectively, when its close vicinity is allowed to relax under the strain applied to the crystal.
