Fig. 1: Domain structure expected due to misfit between a thin film and its substrate. | npj Computational Materials

Fig. 1: Domain structure expected due to misfit between a thin film and its substrate.

From: Ultrafast Bragg coherent diffraction imaging of epitaxial thin films using deep complex-valued neural networks

Fig. 1

a Initial stage of growth has islands locally registered with respect to the LSAO substrate. b In the frame of reference of the LSCO thin film’s crystal lattice, the resulting domains are phase shifted (indicated by \(\varphi\)) relative to each other. c Laboratory frame views of the side and top of the sample mounted on its wedge. d Corresponding side and top views of diffraction geometry. The incident (\({{\bf{k}}}_{{\rm{i}}}\)) and exit (\({{\bf{k}}}_{{\rm{f}}}\)) wave vectors and the wavevector transfer Q, lie in the horizontal scattering plane. The detector plane, perpendicular to \({{\bf{k}}}_{{\rm{f}}}\), is also inclined but still cuts across all the diffraction rods from the sample. e, f Two representative coherent diffraction patterns of the (103) Bragg peak of the sample. The solid ellipse marks the estimate peak width, and the dished ellipse shows the representative speckle size. All the scale bars are 20 \({{{\upmu }}{\rm{m}}}^{-1}\). g Schematic real-space picture of domains falling within the beam footprint (large ellipse) in the detector coordinate.

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