Fig. 8: Comparison between measured and calculated patterns of Ge 2p3/2 at hν = 6 keV.
From: Layered multiple scattering approach to Hard X-ray photoelectron diffraction: theory and application
The top, middle, and bottom rows indicate the total intensity ITOT, intensity difference CDAD and CDAD asymmetry ACDAD. From left to right, there are measured (a, c, e), convoluted-calculated (b*, d*, f*) and purely calculated patterns (b, d, f). Computational results are performed with 177 \({\vec{G}}_{hkl}\). To smooth the computed data, a convolution is applied by the Gaussian filter with the standard deviation σ.
