Fig. 6: Comparison of different model performances in irradiated materials electron microscopy. | npj Computational Materials

Fig. 6: Comparison of different model performances in irradiated materials electron microscopy.

From: Accelerating domain-aware electron microscopy analysis using deep learning models with synthetic data and image-wide confidence scoring

Fig. 6

Our findings reported here are displayed with those reported in literature on various different defect structures (cavities, loops, black dots), with varying model types, training parameters, and evaluation techniques. Expert bounds are calculated from our round robin results. Helps differentiate between visually identical data. For Chen27, * denotes the performance using the image rescaling technique. For Shen38, ** denotes loops of the type a/2〈111〉, while the other is loops of the type a〈100〉.

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