Fig. 1
From: Contactless processing of SiGe-melts in EML under reduced gravity

a Axial and radial images of Si25Ge75 near the solidus temperature T s. b Profiles of temperatures and radii measured upon heating. c Radial images of the ellipsoidally deformed molten sample near the liquidus temperature T l . d Axial images of doped Ge during melting with bright and dark domains due to solid and liquid phases, the arrow indicates the rotation direction