Fig. 4
From: Contactless processing of SiGe-melts in EML under reduced gravity

Oscillations of optic (a) and electronic (b) data measured for the Si10Ge90 drop with triangular pules (8 V, 50 ms), as well as electronic data for the Si25Ge75 (c), and Ge (d) drops with rectangle pulses (7 V, 100 ms), including fittings (red dashed lines) with an exponential decay.