Fig. 2: Characterization of the as-deposited WS2 film.
From: Scalable and low-cost fabrication of flexible WS2 photodetectors on polycarbonate
a Atomic force microscopy image of the step between the WS2 film and the bare polycarbonate substrate. b Line profile measured along the line in a. An average thickness of ~32 nm is estimated from the profile. c Higher magnification atomic force microscopy image of the WS2 film where one can resolve some individual WS2 flakes, parallel to the surface, within the film. d Raman spectrum of the WS2 film. The main peaks associated with WS2 are labeled in the figure.
