Fig. 3: Mechanical characterization of the transient shuttle-based probe for a withdrawal and chronic implant.
From: Transient shuttle for a widespread neural probe with minimal perturbation
a Photograph image of a mesh electrode disconnected from the inserter (scale bar: 3 mm (left), 1 mm (right)). b, c Force measured during withdrawal of the inserter connected with (b) the transient and (c) non-transient shuttle (N = 3: N is the number of the repeated measurements). d Schematic illustration of the behavior of an implanted mesh electrode in a swayed brain. e Schematic illustration of the mechanical modeling used to confirm the performance of the mesh electrode in the dynamic state. f Unbroken agarose gel with the mesh electrode for the vibration test (scale bar: 2 mm). g Broken agarose gel with a needle electrode for a vibration test (scale bar: 2 mm). h Comparison of the resistance changes in the mesh and needle electrode for the vibration test (N = 3). i, j FEA models of the implanted mesh and needle electrode in the swayed state. Panel d is reproduced with permission from Turbosquid and 3D models.
