Fig. 1

a SEM micrograph of an as-cast Al0.3CoCrFeNi showing a single phase microstructure,14 b (b1–b6) XEDS elemental maps of Al, Ti, Zr, Mo, Nb and Ta, respectively, recorded in STEM using the Super-X™ detector, (b7) A STEM-HAADF image with a white line identifying the location of the EDXS linescan shown in (b8).5 (a reprinted with permission from ref. 14 with permission from Elsevier; b reprinted from ref. 5 with permission from Elsevier)