Table. 1 The thickness of boron interface measured by ToF-SIMS.
From: Influence of radiation on borosilicate glass leaching behaviors
Time | Sqrt(t) | ZNBS1-un | ZNBS2-un | ZNBS 3-un | ZNBS1-0.3 dpa | ZNBS2-0.3 dpa | ZNBS3-0.3 dpa |
|---|---|---|---|---|---|---|---|
h | h1/2 | nm | |||||
2 | 1.4 | — | — | — | 359 | 426 | 252 |
4 | 2 | — | — | — | — | 841 | 596 |
6 | 2.5 | 189 | 128 | 170 | — | 1310 | — |
8 | 2.8 | — | — | — | 1552 | 1410 | 1079 |
12 | 3.5 | 237 | 189 | 307 | — | 2044 | 1251 |
18 | 4.2 | — | — | — | 2042 | — | — |
24 | 4.9 | 410 | 436 | 514 | 2135 | 2230 | 1720 |
