Fig. 8: Bright-field TEM images and indexed SAEDPs of the YSZ samples after exposure to CMAS and CN-4 at 1300 oC for 0.1 h.
a The specimen attacked by CMAS. b The specimen attacked by CN-4.
Fig. 8: Bright-field TEM images and indexed SAEDPs of the YSZ samples after exposure to CMAS and CN-4 at 1300 oC for 0.1 h. | npj Materials Degradation
