Fig. 1: A schematic of the DFXM experiments.
From: Intragranular strain and mosaicity in Cu thin films during fast thermomechanical fatigue
The schematic outlines the DFXM experiments performed at the former ID06 HXM beamline at the ESRF. The sample was scanned in transmission mode. A diffraction spot chosen from the Cu 111 DS-ring was magnified by a CRL objective on the downstream far-field detector. 2D orientation scans were conducted by tilting along the φ–χ axes, and 2D axial strain scans were conducted by mapping the φ–2θ axes.
