Fig. 2: ToF-SIMS analyses of AL in corroded ISG surface.
From: Impact of hydrous species in surface alteration layer on mechanical properties of oxide glasses
a ToF-SIMS 3D profile of ion distribution in ISG surfaces corroded for various corrosion time. The ion concentration as a function of distance from the surface when corroded for b 0 min, c 10 min, d 30 min, and e 90 min. The ion concentration is normalized to the silicon concentration at the same sputter depth and then normalized by the bulk concentration of each type of ion.
