Fig. 5: Influence of noise on the entanglement.
From: Protocol for certifying entanglement in surface spin systems using a scanning tunneling microscope
a shows the achievable concurrence and read-out contrast \({{\mathcal{W}}}_{R}-O\) as function of pure dephasing time Tϕ. b shows \(\mathcal{C}\) and \({{\mathcal{W}}}_{R}-O\) as function of T2 for a fixed T2 = 300 ns for the two spins and T = 0.1 K. c \({{\mathcal{W}}}_{R}-O\) as function of Gaussian magnetic field noise causing fluctuations of the resonance frequency of the sensor spin with σ = 30 MHz for three representative cases characterized by T and T2.
