Fig. 1: Si:P δ-layers, ARPES measurements, and the sub-band structure. | npj Quantum Materials

Fig. 1: Si:P δ-layers, ARPES measurements, and the sub-band structure.

From: The sub-band structure of atomically sharp dopant profiles in silicon

Fig. 1

a Schematic of the δ-layer sample and b the symmetric doping potential centred around the position of the P dopant plane. The strong potential created by the P atoms confines the conduction band, developing a 2D electronic structure which has been understood to be comprised of two states, labelled 1Γ (red) and 2Γ (blue). c The Brillouin Zone (BZ) of silicon showing the directions relevant for this work. The blue dashed lines show the 2D BZ, and the pink shading and lines show a 2D slice through the 3D BZ of silicon at the relevant value of kz for this work (darkest shade: 1st bulk BZ). The high symmetry directions kx, ky (red axes), and kxy (black axis) are also indicated. d Tight-binding calculations (following ref. 10) showing the 1Γ and 2Γ states dispersing across EF (with EF adjusted such that the minimum of the dispersion matches with the data in panels (f) and (g)) along the kxy and kx (or ky) directions (blue and green markers, respectively). e ARPES acquisition of a ‘dummy’ Si sample (i.e., Si bulk plus 2 nm epitaxial overlayer, but without the P dopant δ-layer), showing the absence of any states around EF. f ARPES acquisition along the kxy direction showing only two states. A momentum distribution curve (MDC) at the EF shows no presence of additional states. g ARPES measurement along the kx (or ky) direction showing the existence of three states, (marked with blue, red, and yellow lines to serve as a guide for the eye). As discussed in the main text, the agreement between the TB calculation (d) and the ARPES data in panels (f) and (g) is unsatisfactory. h An energy-dependent curve integrated in the range k = 0 ± 0.015 Å−1, further confirming the occupied nature of the 3rd state. All ARPES measurements are performed using hν = 36 eV13,15.

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