Fig. 2: Characterization of the FAPbI3 perovskite films with (target) and without (control) CBz-PAI treatment.

a,b, Top view SEM images of perovskite thin films without CBz-PAI (a) and with CBz-PAI (b); scale bars, 500 nm (a and b). The dotted circles represent PbI2 at the perovskite surface. c,d, GIXRD patterns of perovskite layers without CBz-PAI (c) and with CBz-PAI (d). e,f, CPD analysis of ITO substrate supported perovskite films without CBz-PAI (e) and with CBz-PAI (f). g, CPD variations of the perovskite and perovskite/CBz-PAI films along the white dotted line across the KPFM images shown in e and f. h,i, AIPL spectra (h) and PLQY (i) of treated and untreated perovskite films on glass (five individual samples were used for the measurement). The centre line represents the median value, the bounds of box indicate upper and lower quartiles and the whiskers represent the minimum and maximum values.