Fig. 5: Operational stability test of the control (PEAI as passivator) and target (CBz-PAI) PSC devices.

All samples were aged for 1,100 h MPP tracking at 1 sun and 45 °C. a, PCE during 1,100 h stability test under MPP tracking condition (AM 1.5 G, 100 mW cm−2 in N2, 45 °C). Cross-sectional SEM images of the full PSC devices. b,c, Control device (b) and target device (c) before and after ageing. The dotted circles represent voids. Voids appear in the perovskite film, which appears to be delaminated at the interfaces with perovskite and HTM layer. d,e, Mapping of TOF-SIMS signals of I− in the HTL for control device (d) and target device (e).