Fig. 7: STEM–EDS analysis of the back-contact region.

a, DF-STEM image of ‘Pos1.4’ (lamella 1). b, Semi-transparent rubidium concentration map, as deduced by STEM–EDS, superimposed on the STEM image. Pixels with Rb concentrations at the noise level are set fully transparent. The highest Rb concentration is found at a triple junction. c–i, Distributions of elements close to the Mo back contact, as deduced by STEM–EDS. The color code of the elemental maps refers to the atomic concentrations in at.%, ranging from the corresponding minimum (Min) to the maximum (Max) values.