Extended Data Fig. 2: Scanning electron micrographs of the holography samples employed in this study.
From: Observation of fluctuation-mediated picosecond nucleation of a topological phase
a–c, Pt/CoFeB/MgO samples with patterned tracks for current injection. The holographic field of view (FOV) is defined by an aperture in the Cr/Au mask on the opposite sample side and is visible as shadow behind the tracks. The reference pinholes (four pinholes in (a) and (b), one pinhole in (c)) have their smallest exit aperture also at the opposite sample side, that is, the mask side. The sample in (a) was used for Figs. 2a and 3, sample in (b) for Fig. 2b, and the sample in (c) for Supplementary Section 1. d, Pt/Co sample with continuous magnetic film. The FOV appears as a shadow approximately in the center of the image and is surrounded by four reference pinholes with their smallest exit on the Pt/Co film side. The sample was used for Fig. 2c.
