Extended Data Fig. 4: Scanning electron microscopy (SEM) images. | Nature Materials

Extended Data Fig. 4: Scanning electron microscopy (SEM) images.

From: Highly stretchable organic electrochemical transistors with strain-resistant performance

Extended Data Fig. 4

(a) Scanning electron microscopy (SEM) images of h-DPP-g2T film after KPF6 electrolyte evaporation. (b) SEM/energy-dispersive X-ray spectroscopy (SEM/EDS) mapping of (b) carbon, (c) fluorine, (d) phosphorus, and (e) potassium. (f) SEM image, along with carbon (red) and fluorine (blue) element mapping show excellent matching. The results show that the electrolyte solution penetrates into the h-DPP-g2T pores since cubic KPF6 crystals are detected in the pore areas and but are not located on the honeycomb top walls.

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