Extended Data Fig. 1: X-ray structural characterisation of Pt/YIG/GGG(111). | Nature Materials

Extended Data Fig. 1: X-ray structural characterisation of Pt/YIG/GGG(111).

From: Zero-field polarity-reversible Josephson supercurrent diodes enabled by a proximity-magnetized Pt barrier

Extended Data Fig. 1

a, θ-2θ X-ray diffraction (XRD) scans of Pt/YIG/GGG(111) samples with different Pt thicknesses tPt = 3, 5 and 10 nm. The Pt(111) thin films are crystallized on YIG/GGG(111) substrates. b, Detailed θ-2θ XRD scan near the GGG(444) peak, from which one can determine the epitaxy of the YIG(111) film on the GGG(111) wafer. c, X-ray reflection (XRR) profiling of the Pt/YIG(111)/GGG(111) samples with different tPt. Note that the respective tPt was estimated from the oscillations of each of the XRR curves.

Source data

Back to article page