Extended Data Fig. 6: Temperature-dependent transport measurements of various devices, plotted in designated colors. | Nature Materials

Extended Data Fig. 6: Temperature-dependent transport measurements of various devices, plotted in designated colors.

From: Exceptional electronic transport and quantum oscillations in thin bismuth crystals grown inside van der Waals materials

Extended Data Fig. 6

a, Sheet resistance as a function of temperature. b, Fitted bulk gap as a function of device thickness, averaged from the minimum and maximum thicknesses of each device. Vertical error bar denotes the standard deviation of the fitted bulk gap. Horizontal error bar denotes the range of the thickness of each device.

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