Extended Data Fig. 3: Comparative TEM diffraction patterns between AH and AN500 from [111] orientation.
From: Quantifying short-range order using atom probe tomography
(a) shows the FCC [111] diffraction pattern from the AH sample, with weak diffuse scattering evident, and (c) provides an enlarged view highlighting this feature around the bright dots. (b) depicts the FCC [111] diffraction pattern for the AN500 sample, with strong diffuse scattering observed, which is further emphasized in the enlarged view in (d). The fractional diffuse scattering in (a) and (b) is marked by the {224}/3 planes indicated by yellow arrows. The white arrows and dashed circles in (d) indicate regions of pronounced diffuse intensity, characteristic of SRO.
