Extended Data Fig. 4: Comparative Analysis: Results from the literature versus our tests using APT-SDM aligned along the [111] axis.
From: Quantifying short-range order using atom probe tomography

(a) TEM image and diffraction pattern of the needle specimen fabricated so that the [111] direction coincides with the needle axis in the annealed sample. (b) 2D desorption image showing central pole [111]. (c) Atom map slice (5-nm thick) enlarged in the central pole region. (d) SDM of Cr-Cr, Co-Co, and Ni-Ni along the [111] direction15. (e–g) present our AH sample results using the same SDM method, with peak correlations for Cr-Cr, Co-Co, and Ni-Ni pairs. (h–j) depict the AN500 sample results. The black dashed lines and red dashed lines in the figures use the first peak as a reference to show the amplitude of the peaks.