Fig. 1: SC in MATTG.
a, Schematic of the moiré lattice reconstruction, leading to the formation of an array of twistons (shaded in blue) and moiré solitons (shaded in red), featuring local twist-angle faults. Inset: a close-up perspective of the MATTG moiré, illustrating the contrasting length scales of solitons and moiré. b, In the superconducting state, moiré twistons and solitons in a twisted trilayer graphene serve as weak links within the superconductor, forming a network of JJs. c, Longitudinal resistance Rxx as a function of carrier density n, filling ν and electric field D/ϵ0 at T = 20 mK and B = 0 T. The superconducting regions have been marked by a white dashed outline. d, The d.c. voltage drop across the device as a function of d.c. current bias at optimal hole and electron doping. The hole-doped side and electron-doped side have a maximum critical current of ~400 nA and ~200 nA, respectively. e,f, The d.c. Vd.c.–Id.c. curves at the optimal hole (e) and electron (f) doping with varying D/ϵ0 values. The white part represents a zero voltage drop and the superconducting part before it turns normal (red/blue). The boundary of the white region gives us an idea about the critical current at a particular D/ϵ0 value.
