Extended Data Fig. 4: 1,000 cyclic stretching test results at 30% strain.

1,000 cyclic stretching test results at 30% strain. a, Photographs of the 5 × 5 × 3 phototransistor array during the stretching test. Scale bar, 10 mm. b, Photocurrents of the phototransistor taken after every 200 stretching cycles with 30% strain, until 1,000 cycles. c, Photograph of the 5 × 5 × 3 phototransistor array after stretching test, denoting the regions for cross-sectional SEM analyses. Scale bar, 10 mm. d, Cross-sectional SEM images of the 5 × 5 × 3 phototransistor array, taken from the regions of red- and blue-dotted boxes in c. Scale bar, 100 μm (red dot: horizontal axis, blue dot: vertical axis). e, Line scan EDS result of the gold electrode in red-dotted box region.